How many types of probes do we use regularly? Let's start with some of them

1.1 Probes are categorized into.

1) Optical circuit board test probes: This probe technology can be used mainly for testing circuit boards without installing a single component before, as well as for developing only open and short circuit fault detection;

2) In-line test probes: This probe is mainly used for testing components on the PCB board after they have been installed.wafer testing After all components are installed on the board, the test probe can be used to check whether the components on the board are connected correctly and whether they meet the design requirements;.

3) Microelectronics test probes: this probe is mainly used for wafer test or chip ic test;

1.2 The probes are graded according to the minimum spacing between test points:.

25 ml, 39 ml, 40 ml, 50 ml, 75 ml, 100 ml, 125 ml.

1.3 Probes can be graded according to the shape of the investigating needle:

Needle, Circular Needle, Cup Needle, Standard 4 Claw Crown,wafer probe Bullet Shape, Serrated Shape, Umbrella Needle, and so on.

At the same time, it is important to have a clear understanding of where each needle shape is applicable and to choose the right needle for the test;

2. Probes are categorized by test purpose.

2.1 ICT\\u002FFCT test probes.

Between 2.54mm - 1.27mm in diameter.

Industry standard: 100mm, 75mm, 50mm, 39mm.

Mainly used for in-circuit testing and functional testing,probe holder also known as ICT testing and FCT testing;

2.2 Rotary Test Probes:

In order to be able to reliably overlap heavily contaminated parts with aluminum oxide or surfaces treated with a similar coating;

The rotating tip of the test probe drills holes within the surface of the specimen so that the student is able to provide reliable penetration into the surface of the contact material;

2.5 High Current Probes:

For many industries and applications that use high currents; the

The purpose of the application is accurate measurement, for which test probes with low internal resistance are required;

2.6 Pneumatic Probes:

Each test point is independently lapped, switch activated, difficult to access the test point lapped, interface module manufacturing;

The pneumatic probe is in the initial position and the needle extends only when pressure is applied;

2.7 Battery contact probes:

Used to carry out optimization of contact social effects, good stability and long life;

The utility model has a compact structure, a small installation height, and a large spring force;

Battery needles are generally found in our Bluetooth headsets and small consumer electronics that require charging;

2.8 Switch pin:

Can be used as a test for the presence of the part; the

Can be used as a switch to detect the open \u002F closed state;

Can be used directly as a signal transmitter for process control;

Note that the service life of the switch pin is not very long and is easily damaged, pay attention to the installation;.

2.9 Interface pin:

Used for testing the contact points and surfaces of machine platforms and test fixtures; the interface on the right side of the figure is used for wireless transmission of signals;

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Wafer Probe Test Technology and Wafer Test Defect Analysis Methods

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